AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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The new PointProbe® Plus Q30K-Plus combines the well-known features of the proven PointProbe® Plus series such as a further reduced and more reproducible tip radius as well as a more defined tip shape with a high mechanical quality factor (Q-factor) under ultra high vacuum (UHV) conditions. The typical Q-factor of over 35000 under UHV conditions and the aluminum coating on the detector side provide excellent resolution and an enhanced signal to noise ratio.NANOSENSORS™ PPP-QNCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode) under UHV-conditions. Due to its high Q-factor and the typical features of the PPP series this AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
The probe offers unique features: excellent tip radius of curvature highly doped silicon to dissipate static charge Al coating on detector side of cantilever chemically inert excellent mechanical Q-factor under UHV conditions for high sensitivity
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length. | |||
AFM Tip | |||
Shape | Standard | ||
Height | 10um-15um | ||
Radius | |||
AFM Cantilever | |||
Shape | Beam | ||
Length | 125um (115-135um) | ||
Width | 30um (22.5-37.5um) | ||
Thickness | 4um (3-5um) | ||
Force Constant | 42N/m (10-130N/m) | ||
Resonance Frequency | 330kHz (204-497kHz) | ||