AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | ||||
---|---|---|---|---|
The 4XC series features four different cantilevers for various measurement modes, two on each side of the holder chip:
› 500DC - Contact mode cantilever › 240AC - Soft AC mode cantilever for imaging soft samples › 200AC - Standard AC mode cantilever › 65AC - High resonance frequency cantilever for High speed scanning
The gold coated version is suitable for biological applications, tip functionalization and custom applications.The overall gold coating ensures inertness and electrical conductivity, as well as high and stable laser reflectivity in air, liquid and aggressive chemical environments. The tetrahedral tips are located precisely at the free ends of the cantilevers. This allows the tips to be positioned accurately over the area of interest on the sample surface.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
||||
Coating Description | ||||
70 nm Au on both sides of the cantilevers. | ||||
AFM Tip | ||||
Shape | OPUS | |||
Height | 14um (12-16um) | |||
Radius | <30nm | |||
Full Cone Angle | 0° front, 35° back, <9° side | |||
AFM Cantilever | ||||
Contact mode Cantilever | Soft AC mod Cantilever | Stadard AC mode Cantilever | High freq. AC mode Cantilever | |
Shape | Beam | Beam | Beam | Beam |
Length | 500 um (485-515um) | 240um (225-255um) | 175um (160-190um) | 65um (50-80um) |
Width | 30um (28-32um) | 30um (28-32um) | 40um (38-42um) | 31um (29-33um) |
Thickness | 3um (2.5-3.5um) | 3um (2.5-3.5um) | 3um (2.5-3.5um) | 3um (2.5-3.5um) |
Force Constant | 0.3N/m (0.1-0.6N/m) | 2.5N/m (0.75-5.3N/m) | 9N/m (2.8-21N/m) | 100N/m (35-215N/m) |
Resonance Frequency | 17kHz (11-22kHz) | 75kHz (50-100kHz) | 150kHz (100-200kHz) | 1200kHz (650-1850kHz) |