AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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NanoWorld Pointprobe® EFM probes are designed for electrostatic force microscopy. The force constant and the special coating of the EFM type are optimised for this type of application. This type of probe yields a very high force sensitivity, while simultaneously enabling tapping™ and lift mode operation.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
Additionally, this AFM tip offers an excellent tip radius of curvature.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the cantilever.
The coating process is optimized for stress compensation and wear resistance. Wear at the tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees. |
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AFM Tip | |||
Shape | Standard | ||
Height | 10-15um | ||
Radius | <25nm | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 225um (220-230um) | ||
Width | 28um (22.5-32.5um) | ||
Thickness | 3um (2.5-3.5um) | ||
Force Constant | 2.8/m (1.2-5.5N/m) | ||
Resonance Frequency | 75kHz (60-90kHz) | ||