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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Probes of the 38/tipless series have three different tipless contact mode cantilevers on one side of the holder chip. They can be used in various applications.
Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on both sides of the cantilever. The coating may cause cantilever bending within 3°.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both sides of the cantilever. |
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AFM Tip | |||
Shape | Tipless | ||
AFM Cantilever | |||
Cantilever A | Cantilever B | Cantilever C | |
Shape | Beam | Beam | Beam |
Length | 250um | 350um | 300um |
Width | 32.5um | 32.5um | 32.5um |
Thickness | 1um | 1um | 1um |
Force Constant | 0.09N/m (0.01-0.36N/m) | 0.03N/m (0.003-0.13N/m) | 0.05N/m (0.005-0.21N/m ) |
Resonance Frequency | 20kHz (8-32kHz) | 10kHz (5-17kHz) | 14kHz (6-23kHz ) |