AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Probes of the 36 series have three different force modulation mode cantilevers on one side of the holder chip.
The coating consists of a Co layer on the tipside of the cantilever. The Co layer is formed as a polycrystalline film, which allows steady permanent magnetization in the direction of the tip axis. All chips are pre-magnetized at the facility before shipping to end users. In some cases additional magnetization by an arbitrary strong magnet is required, e.g. SmCo or NdFeB.
The Co coating is protected from oxidation by a thin Cr layer, resulting in longer cantilever performance.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Co and Cr layer on the tipside of the cantilever. Aluminum coating with thickness 30 nm on the backside of the cantilever. | |||
AFM Tip | |||
Shape | Rotated | ||
Height | 15um (12-18um) | ||
Radius | <60nm | ||
Full Cone Angle | 40° | ||
AFM Cantilever | |||
Cantilever A | Cantilever B | Cantilever C | |
Shape | Beam | Beam | Beam |
Length | 110um | 90um | 130um |
Width | 32.5um | 32.5um | 32.5um |
Thickness | 1um | 1um | 1um |
Force Constant | 1N/m (0.1-4.6N/m) | 2N/m (0.2-9N/m) | 0.6N/m (0.06-2.7N/m) |
Resonance Frequency | 90kHz (30-160kHz) | 130kHz (45-240kHz) | 65kHz (25-115kHz) |