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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of the soft samples.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Backside Al coated. Coating thickness - 30 nm. |
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AFM Tip | |||
Shape | Rotated | ||
Height | 15um (12-18um) | ||
Radius | <8nm | ||
Full Cone Angle | 40° | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 450um | ||
Width | 50um | ||
Thickness | 2um | ||
Force Constant | 0.18N/m (0.06-0.4N/m) | ||
Resonance Frequency | 13kHz (10-17kHz) | ||