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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Monolithic silicon AFM probe for contact mode and lateral force mode operation.
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Aluminium reflex coating on detector side of the cantilever, 30 nm thick. |
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AFM Tip | |||
Shape | Rotated | ||
Height | 17um (15-19um) | ||
Setback | 15um (10-20um) | ||
Radius | <10nm | ||
Half Cone Angle | 20°-25° front view 25°-30° from side 10° at the apex | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 450um (440-460um) | ||
Width | 50um (45-55um) | ||
Thickness | 2um (1-3um) | ||
Force Constant | 0.2N/m (0.07-0.4N/m) | ||
Resonance Frequency | 13kHz (9-17kHz) | ||