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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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The 200AC series is designed for AC mode AFM imaging of standard and soft samples. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
- 사용가능 AFM/SPM 장비: AFMWorkShop A.P.E.Research Bruker / J.P.K / S.I.S-GmbH / Veeco / DI Hitachi / Seiko Keysight / Agilent / Pacific NanoTechnology / MI NanoFocus NanoInk Oxford / Asylum Park Systems / PSIA Probes 등. 모든 상용화 장비
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Coating Description | |||
- Al (알루미늄) 30nm 두께 반사면 코팅 |
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AFM Tip | |||
Shape | OPUS | ||
Height | 14um (12-16um) | ||
Radius | <7nm | ||
Half Cone Angle | 0° front, 35° back, <9° side | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 200um (190-210um) | ||
Width | 40um (38-42um) | ||
Thickness | 3.5um (3-4um) | ||
Force Constant | 9N/m (3-22N/m) | ||
Resonance Frequency | 135kHz (85-175kHz) | ||