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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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The 3XC series features three different cantilevers for various measurement modes:500DC - Contact mode cantilever200AC - Standard AC mode cantilever240AC - Soft AC mode cantilever for imaging soft samplesThe uncoated tips offer sharp tip apexes, chemical inertness and high Quality factors. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tips are located precisely at the free ends of the cantilevers. This allows the tips to be positioned accurately over the area of interest on the sample surface.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
30 nm Al on the back side of the cantilever. | |||
AFM Tip | |||
Shape | OPUS | ||
Height | 14um (12-16um) | ||
Radius | <7nm | ||
Half Cone Angle | 0° front, 35° back, <9° side | ||
AFM Cantilever | |||
Contact mode cantilever | Standard tapping mode cantilever | Soft tapping mode cantilever | |
Shape | Beam | Beam | Beam |
Length | 500um (490-510um) | 175um (165-185um) | 240um (230-250um) |
Width | 30um (28-32um) | 40um (38-42um) | 30um (28-32um) |
Thickness | 3um (2.5-3.5um) | 3um (2.5-3.5um) | 3um(2.5-3.5um) |
Force Constant | 0.3N/m (0.1-0.6N/m) | 9N/m (2.8-21N/m) | 2.5N/m (0.75-5.3N/m) |
Resonance Frequency | 17kHz (11-22kHz) | 150kHz (100-200kHz) | 75kHz (50-100kHz) |