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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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NANOSENSORS™ TL-FM probes are designed for special applications where no tip at the cantilever is needed.
The probe offers unique features: no tip highly doped silicon to dissipate static charge chemically inert high mechanical Q-factor for high sensitivityprecise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip compatible with PointProbe® Plus XY-Alignment Series
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Uncoated. | |||
AFM Tip | |||
Shape | Tipless | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 225um (215-235um) | ||
Width | 28um (20-35um) | ||
Thickness | 3um (2-4um) | ||
Force Constant | 2/m (0.5-9.5N/m) | ||
Resonance Frequency | 75kHz (45-115kHz) | ||