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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Probes of the 12 series have 2 silicon nitride cantilevers and tips on each side of the glass holder chip. They are used for soft contact mode applications.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Cr-Au coating is formed as an Au film on a Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on the backside of the cantilever and has a total thickness of 70 nm. |
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AFM Tip | |||
Shape | Pyramid | ||
Height | 3.5um | ||
Radius | <10nm | ||
Full Cone Angle | 40° | ||
AFM Cantilever | |||
Cantilever A | Cantilever B | ||
Shape | Triangle | Triangle | |
Length | 200um (190-210um) | 100um (90-110um) | |
Width | 28um (23-33um) | 13.5um (8.5-18.5um) | |
Thickness | 500nm | 500nm | |
Force Constant | 0.08N/m | 0.32N/m | |
Resonance Frequency | 17kHz | 67kHz | |