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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Cantilevers of the 19 series combine the high frequency and low spring constant, which makes them applicable to imaging soft and fragile surfaces at a relatively high speed in Tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™**.
High-resolution probe with a hydrophobic diamond-like extratip at the apex of the silicon etched probe.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Cr-Au coating on both sides of the cantilever. The coating does not cover the extratip! |
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AFM Tip | |||
Shape | Supersharp | ||
Height | 15um (12-18um) | ||
Radius | <1nm | ||
Half Cone Angle | 40° | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 125um | ||
Width | 22.5um | ||
Thickness | 1um | ||
Force Constant | 0.5N/m (0.05-2.3N/m) | ||
Resonance Frequency | 65kHz (25-120kHz) | ||