AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Sphere 크기 & 재질을 선택해 주세요.
Product Description | |||
---|---|---|---|
The new sQube® colloidal probe combines the well-known features of the proven NANOSENSORS™ Cont series such as high application versatility and compatibility with most commercial SPMs with a reproducible sphere radius instead of a sharp tip. The excellent radius and the minimized variation of diameter provide reproducible signals.
CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
The so called "Colloidal Probe Technique", where single colloids are attached to AFM cantilevers for force measurements, opens the chance for a better understanding of fundamental interactions in a variety of fields.
Examples are adhesion phenomena, particle-surface-interactions, mechanical properties, suspensions, hydrodynamics and boundary slip - to name just some out of an increasing number of applications. It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
|||
Coating Description | |||
None. | |||
AFM Tip | |||
Shape | Sphere | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 450um (440-460um) | ||
Width | 50um (42.5-57.5um) | ||
Thickness | 2um (1-3um) | ||
Force Constant | 0.2N/m (0.02-0.77N/m) | ||
Resonance Frequency | 13kHz (6-21kHz) | ||