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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | ||||
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Versatile monolithic silicon AFM probe with 4 different tipless cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping/ non-contact mode. The short cantilever end is marked by a trapezoidal pattern visible with bare eyes.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | ||||
Aluminum reflex coating on detector side of the cantilever, 30nm thick. | ||||
AFM Tip | ||||
Shape | Tipless | |||
AFM Cantilever | ||||
Cantilever A | Cantilever B | Cantilever C | Cantilever D | |
Shape | Beam | Beam | Beam | Beam |
Length | 500um (490-510um) | 210um (200-220um) | 150um (140-160um) | 100um (90-110um) |
Width | 30um (25-35um) | 30um (25-35um) | 30um (25-35um) | 50um (45-55um) |
Thickness | 2.7um (1.7-3.7um) | 2.7um (1.7-3.7um) | 2.7um (1.7-3.7um) | 2.7um (1.7-3.7um) |
Force Constant | 0.2N/m (0.04-0.7N/m) | 2.7N/m (0.4-10N/m) | 7.4N/m (1-29N/m) | 420/m (7-160N/m) |
Resonance Frequency | 15kHz (10-20kHz) | 80kHz (50-110kHz) | 150kHz (70-230kHz) | 350kHz (200-500kHz) |