AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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The 160AC-FG with a carbon nanofiber at the end of the silicon tip is designed for AC mode AFM imaging of deep trenches. The typical fiber radius of curvature is 10 nm and the diameter is 50 nm at a height of 200 nm away from the apex.
The gold coating ensures high and stable laser reflectivity in air and liquids. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
Please note that while the tetrahedral tip and the tip side of the cantilever are gold coated, the diamond-like spike remains uncoated.
- 사용가능 AFM/SPM 장비: AFMWorkShop A.P.E.Research Bruker / J.P.K / S.I.S-GmbH / Veeco / DI Hitachi / Seiko Keysight / Agilent / Pacific NanoTechnology / MI NanoFocus NanoInk Oxford / Asylum Park Systems / PSIA Probes 등. 모든 상용화 장비
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Coating Description | |||
- Au (골드) 70nm 두께 팁면, 반사면 코팅 후, 팁면 Carbon Spike 적층 |
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AFM Tip | |||
Shape | High Aspect Ratio | ||
Height | 14um (12um-16um) | ||
Radius | <10nm | ||
Half Cone Angle | 0° front, 35° back, <9° side | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 160um (150-170um) | ||
Width | 40um (38-42um) | ||
Thickness | 4um (3.5-4.5um) | ||
Force Constant | 26N/m (8-57N/m) | ||
Resonance Frequency | 300kHz (200-400kHz) | ||