AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
Additionally, this probe offers an excellent tip radius of curvature.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Aluminum Reflex Coating The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever. As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees. |
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AFM Tip | |||
Shape | Standard | ||
Height | 12um (10-15um) | ||
Radius | |||
AFM Cantilever | |||
Shape | Beam | ||
Length | 450um (445-455um) | ||
Width | 50um (45-55um) | ||
Thickness | 2um (1.5-2.5um) | ||
Force Constant | 0.2N/m (0.07-0.4N/m) | ||
Resonance Frequency | 13kHz (9-17kHz) | ||