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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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The Omni™ Tip Enhanced Raman Spectroscopy (TERS) Probes are desgined to acquire topography and Raman spectral information of a sample simultaneously. Omni™-TERS Series Probes have four different type of probe models (i) Omni™-TERS-FM-Ag; (ii) Omni™-TERS-NC-Au; (iii) Omni™-TERS-SNC-Ag; and (iv) Omni™-TERS-SNC-Au.
The unique features of Omni™-TERS Probes include:
It is compatible with: - AFMWORKSHOP - APEReaserch - Bruker - HITACHI - Keysight - Oxford - Park Systems - Probes Inc. - etc. |
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Coating Description | |||
Ag on both side coating of the cantilever | |||
AFM Tip | |||
Shape | Triangular | ||
Material | Silicon | ||
Height | 10-16um | ||
Coating | Ag | ||
AFM Cantilever | |||
Force Constant | 2.7N/m | ||
Resonance Frequency | 60kHz | ||
Length | 245um | ||
Width | 52um | ||
Thickness | 2.8um | ||