AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
---|---|---|---|
The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-CONTAuD probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
The probe offers unique features: excellent tip radius of curvature highly doped silicon to dissipate static charge Au coating on detector side of cantilever chemically inert
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
|||
Coating Description | |||
A metallic layer (gold) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length. | |||
AFM Tip | |||
Shape | Standard | ||
Height | 12um (10-15um) | ||
Radius | |||
AFM Cantilever | |||
Shape | Beam | ||
Length | 450um (440-460um) | ||
Width | 50um (42.5-57.5um) | ||
Thickness | 2um (1-3um) | ||
Force Constant | 0.2N/m (0.02-0.77N/m) | ||
Resonance Frequency | 13kHz (6-21kHz) | ||