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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of the soft samples.
A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Wear-resistant coating with thickness 20 nm on the tipside of the cantilever. Al coating with thickness 30nm on the backside of the cantilever. |
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AFM Tip | |||
Shape | Rotated | ||
Height | 15um (12-18um) | ||
Radius | <20nm | ||
Full Cone Angle | 40° | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 450um | ||
Width | 50um | ||
Thickness | 2um | ||
Force Constant | 0.18N/m (0.06-0.4N/m) | ||
Resonance Frequency | 13kHz (10-17kHz) | ||