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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Probes of the 36 series have three different tapping mode cantilevers on one side of the holder chip. They can be used in various applications.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on the backside of the cantilever. | |||
AFM Tip | |||
Shape | Rotated | ||
Height | 15um (12-18um) | ||
Radius | <8nm | ||
Full Cone Angle | 40° | ||
AFM Cantilever | |||
Cantilever A | Cantilever B | Cantilever C | |
Shape | Beam | Beam | Beam |
Length | 110um | 90um | 130um |
Width | 32.5um | 32.5um | 32.5um |
Thickness | 1um | 1um | 1um |
Force Constant | 1N/m (0.1-4.6N/m) | 2N/m (0.2-9N/m) | 0.6N/m (0.06-2.7N/m) |
Resonance Frequency | 90kHz (30-160kHz) | 130kHz (45-240kHz) | 65kHz (25-115kHz) |