상품이 준비중입니다.
AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
---|---|---|---|
Probes of the 37/tipless series have three different tipless contact mode cantilevers on one side of the holder chip. They can be used in various applications.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
|||
Coating Description | |||
Uncoated. |
|||
AFM Tip | |||
Shape | Tipless | ||
AFM Cantilever | |||
Cantilever A | Cantilever B | Cantilever C | |
Shape | Beam | Beam | Beam |
Length | 250um | 350um | 300um |
Width | 35um | 35um | 35um |
Thickness | 2um | 2um | 2um |
Force Constant | 0.8N/m (0.3-2N/m) | 0.3N/m (0.1-0.6N/m) | 0.4N/m (0.1-1N/m ) |
Resonance Frequency | 40kHz (30-55kHz) | 20kHz (15-30kHz) | 30kHz (20-40kHz ) |