AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape.
NANOSENSORS™ PPP-NCSTAu AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time.
The probe offers unique features: metallic conductivity of the tip Au coating on both sides of the cantilever chemically inert high mechanical Q-factor for high sensitivity It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
A metallic layer (Au) is coated on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts - the typical tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the cantilever. The coating process is optimized for stress compensation. The bending of the cantilever due to stress is less than 3.5% of the cantilever length. | |||
AFM Tip | |||
Shape | Standard | ||
Height | 10-15um | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 150um (140-160um) | ||
Width | 27um (19.5-34.5um) | ||
Thickness | 2.8um (1.8-3.8um) | ||
Force Constant | 7.4N/m (1.2-29N/m) | ||
Resonance Frequency | 160kHz (75-265kHz) | ||