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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Manufactures ultra-sharp solid metallic scanning probes (radius below 10nm)
Provides consulting and nanometer scale physical characterization by Scanning Probe Microscopy (AFM, SCM, C-AFM, EFM, etc.).
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
None | |||
AFM Tip & Cantilever | |||
Tip shank height | 80um | ||
Tip radius | <20nm | ||
Cantilever Length | 300um | ||
Cantilever Width | 60um | ||
Force Constant | 0.8N/m | ||
Resonance Frequency | 9kHz | ||
Material | Platinum |