AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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NANOSENSORS™ CDT-NCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.
The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.
The probe offers unique features: real diamond coating, highly doped high mechanical Q-factor for high sensitivity
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length. | |||
AFM Tip | |||
Shape | Standard | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 125um (115-135um) | ||
Width | 30um (22.5-37.5um) | ||
Thickness | 4um (3-5um) | ||
Force Constant | 80N/m (23-225N/m) | ||
Resonance Frequency | 400kHz (225-610kHz) | ||