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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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ACT Series
It is compatible with: - AFMWORKSHOP - APEReaserch - Bruker - HITACHI - Keysight - Oxford - Park Systems - Probes Inc. - etc. |
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Coating Description | |||
Gold coating on both side of the cantilever | |||
AFM Tip | |||
Shape | Tetrahedral | ||
Height | 15um (14-16um) | ||
Radius | <30nm | ||
Material | Silicon | ||
AFM Cantilever | |||
Shape | Rectangular | ||
Length | 125um | ||
Width | 30um | ||
Thickness | 4um | ||
Force Constant | 37N/m | ||
Resonance Frequency | 300kHz | ||
Custom Mounted Probe Option | |||
We can supply pre-mounted probes for most major AFM systems for a small fee. | |||