상품이 준비중입니다.
AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
---|---|---|---|
The 160AC-SG with a sharp diamond-like spike is designed for high resolution AC mode AFM imaging. The gold coating ensures high and stable laser reflectivity in air and liquids. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
- 사용가능 AFM/SPM 장비: AFMWorkShop A.P.E.Research Bruker / J.P.K / S.I.S-GmbH / Veeco / DI Hitachi / Seiko Keysight / Agilent / Pacific NanoTechnology / MI NanoFocus NanoInk Oxford / Asylum Park Systems / PSIA Probes 등. 모든 상용화 장비
|
|||
Coating Description | |||
- Au (골드) 70nm 두께 팁면, 반사면 코팅 후, 팁면 DLC Spike |
|||
AFM Tip | |||
Shape | Supersharp, OPUS | ||
Height | 14um (12um-16um) | ||
Radius | <1nm | ||
Half Cone Angle | 0° front, 35° back, <9° side | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 160um (150-170um) | ||
Width | 40um (38-42um) | ||
Thickness | 4um (3.5-4.5um) | ||
Force Constant | 26N/m (8-57N/m) | ||
Resonance Frequency | 300kHz (200-400kHz) | ||