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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when the high topographic and phase contrast are necessary. The 15 series is also good for non-contact mode.
High-resolution probe with a hydrophobic diamond-like extratip at the apex of the silicon etched probe.
- 사용가능 AFM/SPM 장비: AFMWorkShop A.P.E.Research Bruker / J.P.K / S.I.S-GmbH / Veeco / DI Hitachi / Seiko Keysight / Agilent / Pacific NanoTechnology / MI NanoFocus NanoInk Oxford / Asylum Park Systems / PSIA Probes 등. 모든 상용화 장비
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Coating Description | |||
- Au (골드) 70nm 두께 팁면, 반사면 코팅 후, 팁면 DLC Spike |
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AFM Tip | |||
Shape | Supersharp | ||
Height | 15um (12-18um) | ||
Radius | <1nm | ||
Full Cone Angle | 40° | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 125um | ||
Width | 30um | ||
Thickness | 4um | ||
Force Constant | 40N/m (20-80N/m) | ||
Resonance Frequency | 325kHz (265-410kHz) | ||