PR Series AFM Probe Contact Non-contact High Resolution Life Science Electrical Measurement

Non-contact Standard High Resolution Visualized Tip High Aspect Ratio Long Scanning High Speed Scanning High sensitivity in UHV

Force Modulation Standard High Resolution Visualized Tip High sensitivity in UHV Long Scanning

Contact Silicon 재질 Silicon Nitride 재질 Quartz 재질 Visualized Tip Long Scanning

Life Science Contact Non-contact

Visualized Tip Contact Multi Non-contact

Conductive Probe Pt 코팅 PtIr 코팅 PtSi 코팅 Solid Metal Conductive Diamond 코팅

Magnetic Low Momentum Medium Momentum Low Coercivity

High Resolution Super Sharp Spike Tip

Indent & Litho DLC 코팅 Diamond 코팅

High Aspect Ratio Ratio 5:1 Ratio 10:1

Silicon Nitride Rectagular Triangular

Tipless & Array Tipless Tipless Array

Ultra High Freq. 2MHz 미만 2MHz 이상

ScanAsyst® PeakForce™ Single Cantilever Multi Cantilever

Functionalized Probe Chemical modified

Special Probe All In One SNOM SThM Plateau Probe Sphere Probe Self Sensing ElctroChemical Probe

SPM Accessories Standard Sample Mica Metal Disc Carbon Tape HOPG

기타 실험용품 템 그리드 나노소재 시료보관 케이스 웨이퍼(기판) & 타겟 인덴터 팁 멤브레인 센서 프로브스테이셥 팁

측정 모드별 프로브 AFM/SPM Mode