상품이 준비중입니다.
pan style="color: #ff6600;">(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.
High durability and hydrophobicity due to Diamond-Like-Carbon coating on tip side of the cantilever.
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick; Aluminum coating on detector side of the cantilever, 30 nm thick | |||
AFM Tip | |||
Shape | Rotated | ||
Height | 17um (15-19um) | ||
Setback | 15um (10-20um) | ||
Radius | <15nm | ||
Half Cone Angle | 20°-25° front view, 25°-30° from side, 10° at the apex | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 125um (115-135um) | ||
Width | 30um (25-35um) | ||
Thickness | 4um (3-5um) | ||
Force Constant | 40N/m (20-75N/m) | ||
Resonance Frequency | 300kHz (200-400kHz) | ||