상품이 준비중입니다.
AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
---|---|---|---|
ACST Series
- 사용가능 AFM/SPM 장비: AFMWorkShop A.P.E.Research Bruker / J.P.K / S.I.S-GmbH / Veeco / DI Hitachi / Seiko Keysight / Agilent / Pacific NanoTechnology / MI NanoFocus NanoInk Oxford / Asylum Park Systems / PSIA Probes 등. 모든 상용화 장비
|
|||
Coating Description | |||
- Al (알루미늄) 30nm 두께 반사면 코팅 |
|||
AFM Tip | |||
Shape | Tetrahedral | ||
Height | 15um (14-16um) | ||
Radius | <6nm | ||
Material | Silicon | ||
AFM Cantilever | |||
Shape | Rectangular | ||
Length | 150um | ||
Width | 28um | ||
Thickness | 3um | ||
Force Constant | 7.8N/m | ||
Resonance Frequency | 150kHz | ||
Custom Mounted Probe Option | |||
We can supply pre-mounted probes for most major AFM systems for a small fee. | |||