AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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SSS-NCL probes are designed for non-contact mode or tapping mode AFM. They are offered as an alternative to the high frequency non contact type (NCH). The SSS-NCL is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.
The probe offers unique features: excellent tip radius of curvature typical aspect ratio at 200 nm from tip apex in the order of 4:1 highly doped silicon to dissipate static charge high mechanical Q-factor for high sensitivity precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip compatible with PointProbe® Plus XY-Alignment Series
- 사용가능 AFM/SPM 장비: AFMWorkShop Bruker / J.P.K / Veeco / DI Pacific NanoTechnolog NanoFocus NanoInk Oxford / Asylum Park Systems Probes 등. 모든 상용화 장비
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Coating Description | |||
- 없음 | |||
AFM Tip | |||
Shape | Supersharp | ||
Radius | < 2nm | ||
Half Cone Angle | < 10° at 200nm from apex | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 225um (125-235um) | ||
Width | 38um (30-45um) | ||
Thickness | 7um (6-8um) | ||
Force Constant | 48N/m (21-98N/m) | ||
Resonance Frequency | 190kHz (146-236kHz) | ||