B-2 AFM OVERVIEW
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Sample Sizes: |
30 mm x 30 mm x 5 mm |
Standard Scanning Modes: |
Vibrating, Non-Vibrating, Phase, LFM, Force Distance |
Scanner: |
50 micron x 50 micron x 17 micron scanner |
Video Optical Microscope: |
5MP Video Camera, 200X |
Table Top B-2 AFM Overview
The B-2 AFM is a basic AFM that provides essential AFM scanning. This AFM is ideal for scientists and engineers that want to visualize nanostructures on surfaces, as well as for educators that want to teach their students about AFM operation and its applications.
Control Software
The B-2 AFM includes the full featured and powerful AFMControl package used in our advanced products. Also included is our unique 7 Step software that guides operators through the process of acquiring an image.
Intuitive Light Lever Design
The light lever's unique design makes aligning the system a routine procedure for users with limited AFM experience. A removable probe holder makes changing probes quick and easy.
Linearized X, Y, and Z Scanners
Piezoelectric X, Y (50 µm) and Z (17 µm) scanners incorporate strain gauges that provide linear scans and rapid zoom-to-feature capabilities.
Standard AFM Scanning Modes
Scanning modes for the B-2 AFM include vibrating (tapping), non-vibrating (contact), phase, and LFM (Force/Distance). These modes will allow users to scan the most common types of samples.
Acoustic Enclosure
The B-2 AFM is encased in an acoustic cabinet made from ¾” MDF and acoustic foam, creating a vibration isolation environment that will provide high-quality scans on almost any lab bench.
Applications
The B-2 AFM is designed for routine scanning and educational applications. With a low price point, it is ideal for scientists and engineers with bigger ideas than budgets. Routine scanning of basic samples is possible with the 7-Step Scanning Software, which is also helpful for students and first-time operators learning the mechanics of an atomic force microscope.
For more advanced users and complex samples, AFMWorkshop offers the AFM Control Software for the B-2 AFM. This is the same software used on all other AFMWorkshop products. Our AFMs are capable machines for the research, industry, and educational communities with applications ranging from nanotechnology to biology.
Integrated Stage and Electronics
The B-2 AFM is designed with an integrated stage and electronics, making it a compact and portable solution for researchers and engineers.
Simplified Key Operational Steps
Aligning the AFM light lever
A unique feature of the B-2 AFM light lever is that the probe is moved to a pre-established position identified with the video optical microscope, therefore removing inaccuracy when aligning the laser.
Exchanging probes
With the removable probe holder, probes can be exchanged in less than a minute. A special support is provided for holding the probe holder when it is not in the light lever force sensor.
Exchanging samples
Samples mounted on metal disks are held in place with a magnetic holder at the top of the piezoelectric stage.
Key Components of the B-2 AFM
Video Optical Microscope
Included with the stage is a video optical microscope with 200X magnification. The video optical microscope is used for locating features on samples for scanning, aligning the light lever, and facilitating probe approach. LED lights at the bottom of the video microscope illuminate the sample.
XY Sample Stage
The location on a sample can be selected for scanning with the XY positioner mechanism, with a range of 6 x 6 mm. The controls for the XY positioner are located conveniently inside the acoustic enclosure on the surface of the AFM stage.
Enclosure
Both structural and acoustic vibrations are reduced with the front opening enclosure. The enclosure is made from high-density material and is lined on the inside with noise reducing foam. Handles on the sides of the enclosure make transporting the AFM easy.
Electronics
The control electronics circuits in the B-2 AFM are the same as those used in over 250 AFMs by AFMWorkshop customers globally, ensuring reliability. The electronics include a high fidelity analog control loop for measuring topography and 24-bit scan DACs for driving the X and Y piezoelectric ceramics. Our unique design offers high resolution as well as a high dynamic range.
Video Microscope
In an AFM a video optical microscope is essential for locating features on a samples specimens surface, facilitating probe approach to a surface, and for aligning the light lever. The B-2 AFM includes a 5 MP CMOS video camera coupled with a high quality focusing optic. Also included, is AFMWorkshop video camera software that has 16 levels of digital zoom, enabled with the mouse scroll wheel.
Scanning and Image Processing Software
The B-2 AFM software is designed for casual users that want to obtain high-quality AFM images without being AFM experts. Furthermore, the B-2 AFM is great for teaching students the basics of AFM operation and training.
7 Step Scanning Software
Get an AFM Image in 7 Steps
At the left side of the B-2 AFM Control software is a list of the 7 steps necessary for measuring an AFM image. By moving through each of the steps, an operator is able to easily obtain AFM images. When one of the steps is selected, the specific window that is required is highlighted. Instructions for each step are provided at the top of the screen.
Gwyddion Image Processing Software
Images created with the B-2B-2AFM are compatible with the free image processing software Gwyddion. Gwyddion is capable of displaying images in 2D and 3D formats in a vast range of pallets. Additional analysis capabilities include line profiles and surface texture measurements.
Basic AFM Modes
Standard with every B-2AFM are non-vibrating (NV) mode and vibrating (V) modes for making topography scans. Additional modes included with the product are lateral force imaging as well as phase mode imaging. All of the scanning modes that can be implemented with a light lever AFM are also possible with the B-2AFM.
Vibrating Mode
Vibrating mode (tapping) is the most common mode for measuring topography images with an AFM. Probe/sample forces as small as a few piconewtons are possible with vibrating mode.
Non-Vibrating Mode
In Non-Vibrating mode (contact), topography images are measured with a cantilever/probe having a very low force constant. Non-vibrating mode is most often used for large area scans on hard materials.
Phase Mode
Phase Mode images, measured simultaneously with vibrating mode images, show regions of different relative hardness on a sample's surface. Phase mode is especially useful when scanning polymer samples.
Lateral Force Mode
Using a four-quadrant detector, the torsion of the cantilever is measured during a non-vibrating mode scan. The amount of torsion depends on the friction between the probe and sample while scanning.
Force/Distance Mode
The interaction forces between a probe and surface are measured with F/D mode. In this mode, the deflection of the cantilever is measured as the sample is moved towards the probe.
Basic AFM Options
Advanced Software
Unlocking the full scanning potential of the B-2B-2AFM is possible with the optional advanced AFM Control Software. This software is used for controlling AFMWorkshop’s more advanced products such as the TT-2 AFM, LS-AFM, and NP-AFM. With this advanced software, operators will be able to control:
Scan Parameters
Including scan rate and scan lines for higher resolution images.
Frequency Range
Allowing measurements with the use of many types of probes
Amplifier Gain Control
Allowing for noise floors under 120 picometers*
Table Top B-2 AFM Specifications