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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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These cantilevers with the high spring constant and the low resonant frequency (below 250 kHz) can be used in Tapping mode in SPM that has a low-frequency feedback loop. These cantilevers also fit SPM systems that do not support probes with short lever arms.
- 사용가능 AFM/SPM 장비: AFMWorkShop A.P.E.Research Bruker / J.P.K / S.I.S-GmbH / Veeco / DI Hitachi / Seiko Keysight / Agilent / Pacific NanoTechnology / MI NanoFocus NanoInk Oxford / Asylum Park Systems / PSIA Probes 등. 모든 상용화 장비
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Coating Description | |||
- Al (알루미늄) 30nm 두께 반사면 코팅 |
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AFM Tip | |||
Shape | Rotated | ||
Height | 15um (12-18um) | ||
Radius | <8nm | ||
Full Cone Angle | 40° | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 225um | ||
Width | 37.5um | ||
Thickness | 7um | ||
Force Constant | 45N/m (30-70N/m) | ||
Resonance Frequency | 190kHz (170-210kHz) | ||