AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Cantilevers of the 19 series combine the high frequency and low spring constant, which makes them applicable to imaging soft and fragile surfaces at a relatively high speed in Tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™**. The cantilevers may also be useful in LFM due to the high sensitivity to the lateral forces.
Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and backside of the cantilever. Resulting tip radius is below 35 nm. The coating may cause cantilever bending within 3°.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both tipside and backside of the cantilever. |
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AFM Tip | |||
Shape | Rotated | ||
Height | 15um (12-18um) | ||
Radius | <35nm | ||
Half Cone Angle | 40° | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 125um | ||
Width | 22.5um | ||
Thickness | 1um | ||
Force Constant | 0.5N/m (0.05-2.3N/m) | ||
Resonance Frequency | 65kHz (25-120kHz) | ||