AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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NANOSENSORS™ DT-NCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
For applications that require hard contact between tip and sample this SPM probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature lies is between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.
The probe offers unique features: real diamond coating high mechanical Q-factor for high sensitivity
- 사용가능 AFM/SPM 장비: AFMWorkShop A.P.E.Research Bruker / J.P.K / S.I.S-GmbH / Veeco / DI Hitachi / Seiko Keysight / Agilent / Pacific NanoTechnology / MI NanoFocus NanoInk Oxford / Asylum Park Systems / PSIA Probes 등. 모든 상용화 장비
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Coating Description | |||
- Al (알루미늄) 30nm 두께 반사면 코팅 Diamond (다이아몬드) 100nm 두께 팁면 코팅 |
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AFM Tip | |||
Shape | Standard | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 125um (115-135um) | ||
Width | 30um (22.5-37.5um) | ||
Thickness | 4um (3-5um) | ||
Force Constant | 80N/m (23-225N/m) | ||
Resonance Frequency | 400kHz (225-610kHz) | ||