AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Pyrex-Nitride Probe – TRiangular Cantilevers Au coated Leading edge in sharpness and durability
NanoWorld Pyrex-Nitride probes are designed for various imaging applications in contact or dynamic mode.
The Pyrex-Nitride probes have silicon nitride cantilevers with very low force constants and integrated oxide sharpened, pyramidal tips with a height of 3.5 µm. The tip is located 4 µm behind the free end of the cantilever. The probe series features a support chip that is made of Pyrex. The TR series features two different triangular cantilevers. Both sides of the chip have identical cantilevers.
All chips are pre-separated prior to shipment and come in Gel-Pak containers.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
The gold coating consists of a 35 nm thick gold layer deposited on the tip side of the cantilevers.
The gold reflex coating deposited on the detector side of the cantilevers enhances the reflectance of the laser beam. As the coating is almost stress-free the bending of the cantilevers due to stress is less than 2 degrees. |
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AFM Tip | |||
Shape | Pyramid | ||
Height | 3.5um | ||
Radius | <40nm | ||
AFM Cantilever | |||
Cantilever 1 | Cantilever 2 | ||
Shape | Triangle | Triangle | |
Length | 100um | 200um | |
Width | 13.5um | 28um | |
Thickness | 0.5um | 0.5um | |
Force Constant | 0.32N/m | 0.08N/m | |
Resonance Frequency | 67kHz | 17kHz | |