AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
NANOSENSORS™ PPP-CONTAu probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
The probe offers unique features: excellent tip radius of curvature highly doped silicon to dissipate static charge Au coating on detector side of cantilever chemically inert
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
A metallic layer (Au) is coated on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts - the typical tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the cantilever. The coating process is optimized for stress compensation. The bending of the cantilever due to stress is less than 3.5% of the cantilever length. | |||
AFM Tip | |||
Shape | Standard | ||
Height | 12um (10-15um) | ||
Setback | 10-15um | ||
Radius | |||
AFM Cantilever | |||
Shape | Beam | ||
Length | 450um (440-460um) | ||
Width | 50um (42.5-57.5um) | ||
Thickness | 2um (1-3um) | ||
Force Constant | 0.2N/m (0.02-0.77N/m) | ||
Resonance Frequency | 13kHz (6-21kHz) | ||