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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by tip tapping.
High-resolution probe with a hydrophobic diamond-like extratip at the apex of the silicon etched probe.
- 사용가능 AFM/SPM 장비: AFMWorkShop A.P.E.Research Bruker / J.P.K / S.I.S-GmbH / Veeco / DI Hitachi / Seiko Keysight / Agilent / Pacific NanoTechnology / MI NanoFocus NanoInk Oxford / Asylum Park Systems / PSIA Probes 등. 모든 상용화 장비
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Coating Description | |||
- Au (골드) 70nm 두께 팁면, 반사면 코팅 후, 팁면 DLC Spike |
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AFM Tip | |||
Shape | Supersharp | ||
Height | 15um (12-18um) | ||
Radius | <1nm | ||
Full Cone Angle | 40° | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 125um | ||
Width | 25um | ||
Thickness | 2.1um | ||
Force Constant | 5N/m (1.8-13N/m) | ||
Resonance Frequency | 160kHz (110-220kHz) | ||