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(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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NANOSENSORS PtSi-CONT are designed for contact mode (repulsive mode) AFM imaging. Furthermore this probe can be used for force-distance spectroscopy or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due a low force constant. For applications that require a wear resistant and electrically conductive tip we recommend this type. NANOSENSORS PtSi-CONT are suitable for C-AFM, Tunneling AFM (TUNA) and Scanning Capacitance Microscopy (SCM).
This probe offers unique features: platinum silicide coating with excellent conductivity and good wear-out behaviour chemically inert high mechanical Q-factor for high sensitivity
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Platinum silicide on both sides of the cantilever. | |||
AFM Tip | |||
Shape | Standard | ||
Radius | <25nm | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 450um (440-460um) | ||
Width | 50um (42.5-57.5um) | ||
Thickness | 2um (1-3um) | ||
Force Constant | 0.2N/m (0.02-0.77N/m) | ||
Resonance Frequency | 13kHz (6-21kHz) | ||