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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Cantilevers of the 18 series are optimal for the Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in Force modulation mode and the true topography imaging of the soft samples.
High-resolution probe with a hydrophobic diamond-like extratip at the apex of the silicon etched probe.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Cr-Au coating on both sides of the cantilever. The coating does not cover the extratip! |
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AFM Tip | |||
Shape | Supersharp | ||
Height | 15um (12-18um) | ||
Radius | <1nm | ||
Full Cone Angle | 35° | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 225um | ||
Width | 27.5um | ||
Thickness | 3um | ||
Force Constant | 2.8N/m (1.2-5.5N/m) | ||
Resonance Frequency | 75kHz (60-90kHz) | ||