AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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NanoWorld PointProbe® FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping™ mode imaging is possible with this AFM probe.All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.Additionally, this probe offers an excellent tip radius of curvature.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever. As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees. | |||
AFM Tip | |||
Shape | Standard | ||
Height | 10-15um | ||
Radius | |||
AFM Cantilever | |||
Shape | Beam | ||
Length | 225um (220-230um) | ||
Width | 28um (22.5-32.5um) | ||
Thickness | 3um (2.5-3.5um) | ||
Force Constant | 2.8/m (1.2-5.5N/m) | ||
Resonance Frequency | 75kHz (60-90kHz) | ||