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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation, and electric modes such as:
scanning capacitance microscopy (SCM) electrostatic force microscopy (EFM) Kelvin probe force microscopy (KFM)
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever. | |||
AFM Tip | |||
Shape | Rotated | ||
Height | 17um (15-19um) | ||
Setback | 15um (10-20um) | ||
Radius | <25nm | ||
Half Cone Angle | 20°-25° front view, 25°-30° from side, 10° at the apex | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 225um | ||
Width | 38um | ||
Thickness | 7um | ||
Force Constant | 48N/m (28-75N/m) | ||
Resonance Frequency | 190kHz (160-220kHz) | ||