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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | ||||
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Probes of the 11 series have four different cantilevers, two on each side of the holder chip. They can be used in various applications.
A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | ||||
Wear-resistant coating with thickness 20 nm on the tipside of the cantilever. Al coating with thickness 30nm on the backside of the cantilever. | ||||
AFM Tip | ||||
Shape | Rotated | |||
Height | 15um (12-18um) | |||
Radius | <20nm | |||
Full Cone Angle | 40° | |||
AFM Cantilever | ||||
Cantilever A | Cantilever B | Cantilever C | Cantilever D | |
Shape | Beam | Beam | Beam | Beam |
Length | 500um | 210um | 150um | 100um |
Width | 30um | 30um | 30um | 50um |
Thickness | 2.7um | 2.7um | 2.7um | 2.7um |
Force Constant | 0.2N/m (0.1-0.4N/m) | 2.7N/m (1.1-5.6N/m) | 7N/m (3-16N/m) | 42N/m (17-90N/m) |
Resonance Frequency | 15kHz (12-18kHz) | 80kHz (60-100kHz) | 155kHz (115-200kHz) | 350kHz (250-465kHz) |