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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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These cantilevers with the high spring constant and the low resonant frequency (below 250 kHz) can be used in Tapping mode in SPM that has a low-frequency feedback loop. These cantilevers also fit SPM systems that do not support probes with short lever arms.
Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and backside of the cantilever. Resulting tip radius is below 35 nm. The coating may cause cantilever bending within 3°.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both tipside and backside of the cantilever. | |||
AFM Tip | |||
Shape | Rotated | ||
Height | 15um (12-18um) | ||
Radius | <35nm | ||
Full Cone Angle | 40° | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 225um | ||
Width | 37.5um | ||
Thickness | 7um | ||
Force Constant | 45N/m (30-70N/m) | ||
Resonance Frequency | 190kHz (170-210kHz) | ||