AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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NanoWorld Pointprobe® NCSTR AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. Thus, tip and sample wear could be significantly decreased.All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.Additionally, this probe offers an excellent tip radius of curvature.
- 사용가능 AFM/SPM 장비: AFMWorkShop A.P.E.Research Bruker / J.P.K / S.I.S-GmbH / Veeco / DI Hitachi / Seiko Keysight / Agilent / Pacific NanoTechnology / MI NanoFocus NanoInk Oxford / Asylum Park Systems / PSIA Probes 등. 모든 상용화 장비
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Coating Description | |||
- Al (알루미늄) 30nm 두께 반사면 코팅 |
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AFM Tip | |||
Shape | Standard | ||
Height | 10-15um | ||
Radius | |||
AFM Cantilever | |||
Shape | Beam | ||
Length | 150um (145-155um) | ||
Width | 27um (22-32um) | ||
Thickness | 2.8um (2.3-3.3um) | ||
Force Constant | 7.4/m (3-16N/m) | ||
Resonance Frequency | 160kHz (120-205kHz) | ||