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AFM/SPM Standard Sample
(원자현미경/주사탐침현미경 표준시편)
Product Description | |||
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The standard is used for a very precise x-y-calibration of the scanning mechanism. The standard consists of a 2-dimensional lattice of inverted square pyramids with 200nm pitch etched into a silicon chip. The active area is located in the center of the chip and is surrounded by the FindMe structure. The lattice of inverted pyramids make up the active area. |