AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.NANOSENSORS™ PPP-NCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
This AFM probe offers unique features: excellent tip radius of curvature highly doped silicon to dissipate static charge Al coating on detector side of cantilever high mechanical Q-factor for high sensitivity
- 사용가능 AFM/SPM 장비: AFMWorkShop A.P.E.Research Bruker / J.P.K / S.I.S-GmbH / Veeco / DI Hitachi / Seiko Keysight / Agilent / Pacific NanoTechnology / MI NanoFocus NanoInk Oxford / Asylum Park Systems / PSIA Probes 등. 모든 상용화 장비
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Coating Description | |||
- Al (알루미늄) 30nm 두께 반사면 코팅 |
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AFM Tip | |||
Shape | Standard | ||
Height | 12um (10-15um) | ||
Radius | |||
AFM Cantilever | |||
Shape | Beam | ||
Length | 125um (115-135um) | ||
Width | 30um (22.5-37.5um) | ||
Thickness | 4um (3-5um) | ||
Force Constant | 42N/m (10-130N/m) | ||
Resonance Frequency | 330kHz (204-497kHz) | ||