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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | ||||
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Probes of the 11 series have four different cantilevers, two on each side of the holder chip. They can be used in various applications.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | ||||
Backside Al coated. Coating thickness - 30 nm. | ||||
AFM Tip | ||||
Shape | Rotated | |||
Height | 15um (12-18um) | |||
Radius | <8nm | |||
Full Cone Angle | 40° | |||
AFM Cantilever | ||||
Cantilever A | Cantilever B | Cantilever C | Cantilever D | |
Shape | Beam | Beam | Beam | Beam |
Length | 500um | 210um | 150um | 100um |
Width | 30um | 30um | 30um | 50um |
Thickness | 2.7um | 2.7um | 2.7um | 2.7um |
Force Constant | 0.2N/m (0.1-0.4N/m) | 2.7N/m (1.1-5.6N/m) | 7N/m (3-16N/m) | 42N/m (17-90N/m) |
Resonance Frequency | 15kHz (12-18kHz) | 80kHz (60-100kHz) | 155kHz (115-200kHz) | 350kHz (250-465kHz) |