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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Cantilevers of the 19 series combine the high frequency and low spring constant, which makes them applicable to imaging soft and fragile surfaces at a relatively high speed in Tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™**. The cantilevers may also be useful in LFM due to the high sensitivity to the lateral forces.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Backside Al coated. Coating thickness - 30 nm. | |||
AFM Tip | |||
Shape | Rotated | ||
Height | 15um (12-18um) | ||
Radius | <8nm | ||
Full Cone Angle | 40° | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 125um | ||
Width | 22.5um | ||
Thickness | 1um | ||
Force Constant | 0.5/m (0.05-2.3N/m) | ||
Resonance Frequency | 65kHz (25-120kHz) | ||