AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
The NANOSENSORS™ PPP-CONTSCR is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
The probe offers unique features: excellent tip radius of curvature highly doped silicon to dissipate static charge Al coating on detector side of cantilever high mechanical Q-factor for high sensitivity precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip compatible with PointProbe® Plus XY-Alignment Series
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length. | |||
AFM Tip | |||
Shape | Rotated | ||
Height | 12um (10-15um) | ||
Radius | |||
AFM Cantilever | |||
Shape | Beam | ||
Length | 225um (215-235um) | ||
Width | 48um (40-55um) | ||
Thickness | 1um (0.1-2um) | ||
Force Constant | 0.2N/m (0.01-1.87N/m) | ||
Resonance Frequency | 25kHz (1-57kHz) | ||